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Measuring operational parameters at the guided surface waveguide probe

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申请人Cpg Technologies, Llc
发明人James F. Corum
公开号WO2018164957A1
申请日2018-03-02
公开日2018-09-13

摘要

Disclosed is an exemplary guided surface waveguide probe. In one embodiment, the guided surface waveguide probe comprises a charge terminal elevated to a height above the lossy conducting medium; a support structure that supports the charge terminal; an internal coil that is supported within the …

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